| AVS 47th International Symposium | |
| Magnetic Interfaces and Nanostructures | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | MI+NS+NANO 6-TuM1 Invited Paper Scanning Electron Microscopy with Polarization Analysis (SEMPA) Imaging of Surface and Thin Film Magnetic Microstructure J. Unguris, National Institute of Standards and Technology |
| 9:00am | MI+NS+NANO 6-TuM3 'Magnetic-Laboratory' on an AFM Tip B.K. Chong, H.P. Zhou, G. Mills, L. Donaldson, J.M.R. Weaver, University of Glasgow, UK |
| 9:20am | MI+NS+NANO 6-TuM4 High Anisotropy, High Gradient Magnetic Tips For Magnetic Resonance Force Microscopy H.J. Mamin, B.C. Stipe, C.S. Yannoni, D. Rugar, IBM Almaden Research Center, T.D. Stowe, T.W. Kenny, Stanford University, D. Streblechenko, M.R. Scheinfein, Arizona State University |
| 9:40am | MI+NS+NANO 6-TuM5 Invited Paper Quantitative Magnetic Force Microscopy and Exchange Force Microscopy: New Tools for Magnetic Imaging H.J. Hug, P.J.A. van Schendel, S. Martin, R. Hoffmann, P. Kappenberger, M.A. Lantz, H.-J. Guentherodt, University of Basel, Switzerland |
| 10:20am | MI+NS+NANO 6-TuM7 Magnetic Force Microscopy of Coupled and Decoupled Micrometer Scale Permalloy Structures U. Memmert, A.N. Müller, U. Hartmann, University of Saarbrücken, Germany, J. Jorzick, C. Krämer, S.O. Demokritov, B. Hillebrands, University of Kaiserslautern, Germany, E. Sondergard, M. Bailleul, C. Fermon, CEA Saclay, France |
| 10:40am | MI+NS+NANO 6-TuM8 Correlation of Structural and Magnetic Properties of Fe/Cr(001) Studied by Combined SP-STM and MFM M. Kleiber, R. Ravlic, M. Bode, R. Wiesendanger, University of Hamburg, Germany |
| 11:00am | MI+NS+NANO 6-TuM9 Flux Lattice Imaging of a Patterned Nb Film with a Cryogenic Magnetic Force Microscope M. Roseman, P. Grutter, McGill University, Canada, V. Metlushko, Argonne National Laboratory |
| 11:20am | MI+NS+NANO 6-TuM10 Magnetic Field Measurements of Current-Carrying Devices by Force Sensitive Magnetic Force Microscopy with Potential Correction R.A. Alvarez, S.V. Kalinin, D.A. Bonnell, University of Pennsylvania |
| 11:40am | MI+NS+NANO 6-TuM11 Evaluation of MFM for Probing Electromigration Processes R. Yongsunthon, J. McCoy, E.D. Williams, University of Maryland |